DocumentCode :
1523817
Title :
Monolithic sampling head IC
Author :
Miura, Akira ; Yakihara, Tsuyoshi ; Uchida, Satoru ; Oka, Sadaharu ; Kobayashi, Shinji ; Kamada, Hiromi ; Dobashi, Machio
Author_Institution :
Yokogawa Electric Corp., Tokyo, Japan
Volume :
38
Issue :
12
fYear :
1990
fDate :
12/1/1990 12:00:00 AM
Firstpage :
1980
Lastpage :
1985
Abstract :
A monolithic sampling head IC composed of a resonant tunneling diode (RTD) for the sampling pulse generator and Schottky barrier diodes for the sampling bridge has been developed. The RTD was made using an In 0.53Ga0.47As-AlAs structure (pseudomorphic strained superlattice). For this type of high switching voltage RTD, a peak-to-valley ratio (P/V ratio) of 9 at 202°C peak-to-peak switching voltages of 1.5 V or more at room temperature were achieved. The Schottky barrier diodes were made from an (In0.53Ga0.47As)0.5(In0.52Al 0.48As)0.5 compound. A frequency bandwidth of at least 26 GHz was obtained. When attempting to use a quantum effect device (such as an RTD) in a practical application, the most important factor to consider is its reliability. Good results were achieved in an endurance test of this device, in which it was made to continuously oscillate between 600 MHz to 1 GHz at 90°C for more than 1000 h
Keywords :
MMIC; Schottky-barrier diodes; bridge circuits; microwave measurement; mixers (circuits); network analysers; pulse generators; resonant tunnelling devices; signal processing equipment; tunnel diodes; 1.5 V; 26 GHz; In0.53Ga0.47As-AlAs structure; Pt-(In0.53Ga0.47As)0.5(In 0.52Al0.49As)0.5; RTD; Schottky barrier diodes; endurance test; high frequency measuring instruments; high speed waveform analysers; high switching voltage; monolithic sampling head IC; pseudomorphic strained superlattice; quantum effect device; reliability; resonant tunneling diode; sampling bridge; sampling pulse generator; Bridge circuits; Monolithic integrated circuits; Pulse generation; Resonant tunneling devices; Sampling methods; Schottky barriers; Schottky diodes; Superlattices; Temperature; Voltage;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.64583
Filename :
64583
Link To Document :
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