Title :
Automated system for noise-measurements on low-ohmic samples and magnetic sensors
Author :
Jonker, R.J.W. ; Briaire, J. ; Vandamme, L.K.J.
Author_Institution :
Eindhoven Univ. of Technol., Netherlands
fDate :
6/1/1999 12:00:00 AM
Abstract :
An automated system for electronic noise measurements on metal films is presented. This new system, controlled by a personal computer which utilizes National Instruments´ LabVIEW software, is designed to measure low frequency noise as a function of an externally imposed magnetic field and as a function of a dc bias current in low-ohmic samples and magnetic sensors. With this system we are able to measure continuously for several days, during which the measured spectra are collected, processed and stored for further analysis
Keywords :
1/f noise; automatic test equipment; bridge circuits; digital control; electric noise measurement; magnetic sensors; metallic thin films; preamplifiers; ATE; DC bias current; LabVIEW software; Wheatstone bridge; automated system; digital control; electronic noise measurements; externally imposed magnetic field; low frequency noise; low-ohmic samples; magnetic sensor; magnetoresistors; metal films; personal computer controlled; ultralow-noise amplifier; Control systems; Instruments; Low-frequency noise; Magnetic field measurement; Magnetic films; Magnetic noise; Magnetic sensors; Microcomputers; Noise measurement; Software design;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
