DocumentCode :
1524015
Title :
The efficiency of methods for measuring A/D converter linearity
Author :
Capofreddi, Peter D. ; Wooley, Bruce A.
Author_Institution :
Integrated Circuits Lab., Stanford, CA, USA
Volume :
48
Issue :
3
fYear :
1999
fDate :
6/1/1999 12:00:00 AM
Firstpage :
763
Lastpage :
769
Abstract :
In this paper, the efficiency of three methods commonly used to measure the linearity characteristics of precision Nyquist-rate analog-to-digital (A/D) converters is evaluated. The efficiency of each method, which is determined by the time required to obtain linearity estimates at a specified level of accuracy, is compared to the maximum efficiency that is theoretically achievable, as given by the Cramer-Rao bound. Simulation results are presented for two open-loop measurement methods, the tally and weight method and the code density method, demonstrating that the code density method obtains an efficiency close to the theoretical optimum over a wide range of measurement times and converter noise levels, whereas the tally and weight method falls short of the optimum for converters with noise levels exceeding ¼ LSB. The efficiency of the servo loop method, a common closed-loop method for measuring linearity, is similarly evaluated, and is found to fall short of the maximum efficiency that is theoretically achievable in the closed-loop configuration. A modified closed-loop measurement method is described that obtains an efficiency close to the theoretical optimum through the use of maximum-likelihood estimation
Keywords :
analogue-digital conversion; characteristics measurement; computerised instrumentation; integrated circuit measurement; integrated circuit testing; maximum likelihood estimation; probability; signal sampling; A/D converter linearity; Cramer-Rao bound; closed-loop method; code density method; linearity characteristics; linearity testing; maximum-likelihood estimation; measurement methods efficiency; open-loop measurement methods; precision Nyquist-rate ADC; probability distribution; production testing; servo loop method; tally and weight method; Analog computers; Analog-digital conversion; Circuit testing; Density measurement; Integrated circuit measurements; Laboratories; Linearity; Noise level; Noise measurement; Servomechanisms;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.772218
Filename :
772218
Link To Document :
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