DocumentCode

1524069

Title

Breakthroughs Will Leave Their Mark On Many Key Technologies

Author

Geppert, L. ; Sweet, W.

Volume

35

Issue

1

fYear

1998

Firstpage

19

Lastpage

22

Keywords

Back; Biomedical optical imaging; Copper; Electron beams; Mars; Moore´s Law; Solid state circuits; Space technology; Technological innovation; Wiring;

fLanguage

English

Journal_Title

Spectrum, IEEE

Publisher

ieee

ISSN

0018-9235

Type

jour

DOI

10.1109/MSPEC.1998.645974

Filename

645974