DocumentCode :
1524069
Title :
Breakthroughs Will Leave Their Mark On Many Key Technologies
Author :
Geppert, L. ; Sweet, W.
Volume :
35
Issue :
1
fYear :
1998
Firstpage :
19
Lastpage :
22
Keywords :
Back; Biomedical optical imaging; Copper; Electron beams; Mars; Moore´s Law; Solid state circuits; Space technology; Technological innovation; Wiring;
fLanguage :
English
Journal_Title :
Spectrum, IEEE
Publisher :
ieee
ISSN :
0018-9235
Type :
jour
DOI :
10.1109/MSPEC.1998.645974
Filename :
645974
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1524069
