Title :
Fluorescence-Assisted Gamma Spectrometry for Surface Contamination Analysis
Author :
Ihantola, Sakari ; Sand, Johan ; Perajarvi, Kari ; Toivonen, Juha ; Toivonen, H.
Author_Institution :
STUK-Radiat. & Nucl. Safety Authority, Helsinki, Finland
Abstract :
A fluorescence-based alpha-gamma coincidence spectrometry approach has been developed for the analysis of alpha-emitting radionuclides. The thermalization of alpha particles in air produces UV light, which in turn can be detected over long distances. The simultaneous detection of UV and gamma photons allows detailed gamma analyses of a single spot of interest even in highly active surroundings. Alpha particles can also be detected indirectly from samples inside sealed plastic bags, which minimizes the risk of cross-contamination. The position-sensitive alpha-UV-gamma coincidence technique reveals the presence of alpha emitters and identifies the nuclides ten times faster than conventional gamma spectrometry.
Keywords :
particle spectrometers; position sensitive particle detectors; ίuorescence-based alpha-gamma coincidence spectrometry; UV light; UV photon detection; alpha particle thermalization; alpha-emitting radionuclide analysis; fluorescence-assisted gamma spectrometry; gamma photon detection; position-sensitive alpha-UV-gamma coincidence technique; sealed plastic bags; single spot gamma analyses; surface contamination analysis; Alpha particles; Atmospheric measurements; Detectors; Logic gates; Particle measurements; Photonics; Pollution measurement; Alpha-induced UV; coincidence technique; focused gamma measurement;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2013.2238249