Title :
Soft errors in advanced semiconductor devices-part I: the three radiation sources
Author :
Baumann, Robert C.
Author_Institution :
Silicon Technol. Dev. Group, Texas Instrum. Inc., Dallas, TX, USA
fDate :
3/1/2001 12:00:00 AM
Abstract :
In this review paper, we summarize the key distinguishing characteristics and sources of the three primary radiation mechanisms responsible for inducing soft errors in semiconductor devices and discuss methods useful for reducing the impact of the effects in final packaged parts
Keywords :
integrated circuit packaging; integrated circuit reliability; radiation effects; advanced semiconductor devices; distinguishing characteristics; final packaged parts; primary radiation mechanisms; radiation sources; soft errors; Alpha particles; Energy states; Ionization; Ionizing radiation; Isotopes; Neutrons; Packaging; Radioactive materials; Random access memory; Semiconductor devices;
Journal_Title :
Device and Materials Reliability, IEEE Transactions on
DOI :
10.1109/7298.946456
