DocumentCode :
1524219
Title :
Intelligent artefact identification in electroencephalography signal processing
Author :
Wu, J. ; Ifeachor, E.C. ; Allen, E.M. ; Wimalaratna, S.K. ; Hudson, N.R.
Author_Institution :
Sch. of Electron. Commun. & Electr. Eng., Plymouth Univ., UK
Volume :
144
Issue :
5
fYear :
1997
fDate :
9/1/1997 12:00:00 AM
Firstpage :
193
Lastpage :
201
Abstract :
The need for automated analysis of the EEG for objectivity, efficiency and to improve the contribution it makes to diagnosis and the evaluation of treatment options, if available, is widely recognised. However, automated analysis of EEG is hampered by the lack of a reliable means of dealing with EEG artefacts such as those due to blinks, eye movements, and patient movements. The paper presents a new approach for detecting and classifying artefacts. The resulting system is intended to serve as a front end for an automated EEG interpretation system. It can also serve as an input to an artefact removal or rejection system. An important concept in the new approach is to keep the three fundamental stages of artefact processing: artefact detection, classification, and removal/rejection separate. Thus, it is possible to optimise the stages separately and to cater for different requirements in routine EEG. In the new method, a set of feedforward multilayer neural networks together with a knowledge based system are used to process frequency, time, and spatial features to detect, classify, and mark sections of the EEG. The output of the system is in the form of an EEG artefact report. Tests on the system on EEG records from volunteers indicate a success rate of over 90%. At present, the system operates off-line, but it is being combined with an automated analysis system for routine clinical practice
Keywords :
autoregressive processes; electroencephalography; feature extraction; feedforward neural nets; medical expert systems; medical signal processing; pattern classification; spectral analysis; EEG artefact report; EEG artefacts; artefact removal/rejection system; artefacts classification; automated EEG interpretation system; blinks; electroencephalography signal processing; eye movements; feature extraction; feedforward multilayer neural networks; frequency features; intelligent artefact identification; knowledge based system; patient movements; spatial features; time features;
fLanguage :
English
Journal_Title :
Science, Measurement and Technology, IEE Proceedings -
Publisher :
iet
ISSN :
1350-2344
Type :
jour
DOI :
10.1049/ip-smt:19971318
Filename :
620455
Link To Document :
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