DocumentCode :
1524291
Title :
Arc root commutation from moving contacts in low voltage devices
Author :
McBride, John W. ; Pechrach, Kesorn ; Weaver, Paul M.
Author_Institution :
Sch. of Eng. Sci., Southampton Univ., UK
Volume :
24
Issue :
3
fYear :
2001
fDate :
9/1/2001 12:00:00 AM
Firstpage :
331
Lastpage :
336
Abstract :
This paper focus on the arc commutation from a moving contact and in particular on the anode motion of a high current arc in low voltage current limiting circuit breakers. Recent investigations have observed that the anode arc root motion is affected by arc chamber geometry. It was previously assumed that cathode root motion was the dominant process. The study uses a flexible test apparatus with a solid state high speed imaging system. The experimental results presented show the influence of arc chamber venting, current level, current polarity and contact velocity on arc motion, Particular emphasis is made on the anode motion. The physical processes occurring in the anode root are discussed and related to the observed motion. The results show that the anode root is retarded at the tip of the moving contact and that this is primarily related to the venting process in the arc chamber
Keywords :
circuit breakers; circuit-breaking arcs; commutation; electrical contacts; anode motion; arc chamber geometry; arc root commutation; cathode root motion; chamber venting; contact velocity; current level; current limiting circuit breakers; current polarity; high current arc; low voltage devices; moving contacts; solid state high speed imaging system; Anodes; Cathodes; Circuit breakers; Circuit faults; Circuit testing; Current limiters; Geometry; Low voltage; Solid state circuits; System testing;
fLanguage :
English
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3331
Type :
jour
DOI :
10.1109/6144.946475
Filename :
946475
Link To Document :
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