DocumentCode
1524305
Title
The influence of arc chamber wall material on arc gap dielectric recovery voltage
Author
Shea, John J.
Author_Institution
Cutler-Hammer Inc., Pittsburgh, PA, USA
Volume
24
Issue
3
fYear
2001
fDate
9/1/2001 12:00:00 AM
Firstpage
342
Lastpage
348
Abstract
The dielectric breakdown strength of an arcing contact gap after current zero was compared when using alumina, polyamide 6/6 (PA 6/6), and polyoxymethylene (POM) arc chamber wall materials. Plasma characteristics were obtained for each material by applying a reverse recovery voltage across the open contacts at a predetermined delay time after current zero. Ablation from each type of chamber wall material produced different plasma compositions each with different recovery voltage, arc voltage, and pressure characteristics. Tests were performed for an arcing current of 12 kAp, for one half-cycle using symmetric AgW contacts. A thermal breakdown model along with an exponential curve fit to the measured results were used to obtain the initial holdoff voltage and plasma time constant for each material. PA 6/6 and POM had similar time constants with PA 6/6 having slightly better performance. Two types of breakdown mechanisms were identified-thermal and dielectric
Keywords
circuit breakers; circuit-breaking arcs; electric breakdown; electric strength; electrical contacts; silver alloys; tungsten alloys; AgW; arc chamber wall material; arc gap dielectric recovery voltage; arcing current; breakdown mechanisms; chamber wall material; circuit breakers; dielectric breakdown strength; initial holdoff voltage; open contacts; plasma characteristics; plasma compositions; plasma time constant; polyamide; polyoxymethylene; predetermined delay time; pressure characteristics; recovery voltage; reverse recovery voltage; symmetric AgW contacts; thermal breakdown model; time constants; Breakdown voltage; Composite materials; Delay effects; Dielectric breakdown; Dielectric materials; Performance evaluation; Plasma materials processing; Plasma measurements; Plasma properties; Testing;
fLanguage
English
Journal_Title
Components and Packaging Technologies, IEEE Transactions on
Publisher
ieee
ISSN
1521-3331
Type
jour
DOI
10.1109/6144.946477
Filename
946477
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