• DocumentCode
    1524305
  • Title

    The influence of arc chamber wall material on arc gap dielectric recovery voltage

  • Author

    Shea, John J.

  • Author_Institution
    Cutler-Hammer Inc., Pittsburgh, PA, USA
  • Volume
    24
  • Issue
    3
  • fYear
    2001
  • fDate
    9/1/2001 12:00:00 AM
  • Firstpage
    342
  • Lastpage
    348
  • Abstract
    The dielectric breakdown strength of an arcing contact gap after current zero was compared when using alumina, polyamide 6/6 (PA 6/6), and polyoxymethylene (POM) arc chamber wall materials. Plasma characteristics were obtained for each material by applying a reverse recovery voltage across the open contacts at a predetermined delay time after current zero. Ablation from each type of chamber wall material produced different plasma compositions each with different recovery voltage, arc voltage, and pressure characteristics. Tests were performed for an arcing current of 12 kAp, for one half-cycle using symmetric AgW contacts. A thermal breakdown model along with an exponential curve fit to the measured results were used to obtain the initial holdoff voltage and plasma time constant for each material. PA 6/6 and POM had similar time constants with PA 6/6 having slightly better performance. Two types of breakdown mechanisms were identified-thermal and dielectric
  • Keywords
    circuit breakers; circuit-breaking arcs; electric breakdown; electric strength; electrical contacts; silver alloys; tungsten alloys; AgW; arc chamber wall material; arc gap dielectric recovery voltage; arcing current; breakdown mechanisms; chamber wall material; circuit breakers; dielectric breakdown strength; initial holdoff voltage; open contacts; plasma characteristics; plasma compositions; plasma time constant; polyamide; polyoxymethylene; predetermined delay time; pressure characteristics; recovery voltage; reverse recovery voltage; symmetric AgW contacts; thermal breakdown model; time constants; Breakdown voltage; Composite materials; Delay effects; Dielectric breakdown; Dielectric materials; Performance evaluation; Plasma materials processing; Plasma measurements; Plasma properties; Testing;
  • fLanguage
    English
  • Journal_Title
    Components and Packaging Technologies, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3331
  • Type

    jour

  • DOI
    10.1109/6144.946477
  • Filename
    946477