• DocumentCode
    1524388
  • Title

    Power enhancement of a Doppler-frequency-up-shift scattered wave by a relativistic electron beam drifting in a reversed, tapered axial guide magnetic field

  • Author

    Zhang, Shi-chang ; Liang, Xiao-Ping ; Liu, Yao-Wu ; Jin, Jian-Bo

  • Author_Institution
    Dept. of Appl. Phys., Southwest Jiaotong Univ., Sichuan, China
  • Volume
    27
  • Issue
    2
  • fYear
    1999
  • fDate
    4/1/1999 12:00:00 AM
  • Firstpage
    575
  • Lastpage
    579
  • Abstract
    A transverse-electric (TE) wave with a Doppler-upshift frequency may be excited when a backward wave is scattered by a relativistic electron beam. Credible three-dimensional nonlinear simulations are presented to demonstrate the power enhancement of the scattered wave by making use of a properly reversed, tapered axial guide magnetic field. The influences of the taper slope and the taper starting point of the reversed axial guide magnetic field on the power of radiation fields are discussed. Simulations show that the peak power of 93 kW at a wavelength of 3 mm observed in a recent experiment could be increased up to 500 kW through the proposed method. Compared to the case of a tapered positive guide magnetic field, the method studied in the present paper is more effective to enhance the power of the scattered wave
  • Keywords
    backward wave tubes; free electron lasers; magnetic fields; relativistic electron beam tubes; wigglers; 3 mm; 500 kW; Doppler-frequency-up-shift scattered wave; backward wave; free-electron lasers; power enhancement; radiation fields; relativistic electron beam; taper slope; taper starting point; tapered axial guide magnetic field; three-dimensional nonlinear simulations; transverse-electric wave; wigglers; Electromagnetic scattering; Electron beams; Free electron lasers; Frequency; Magnetic fields; Oscillators; Tellurium; Wavelength conversion; X-ray lasers; X-ray scattering;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/27.772288
  • Filename
    772288