Title :
The Thermal Resistance of Solder Joints in High Brightness Light Emitting Diode (HB LED) Packages
Author :
Yoon, Young-Bok ; Park, Jin-Woo
Author_Institution :
Comput.-Aided Eng. Group, Samsung Electro-Mech. Co. Ltd., Suwon, South Korea
Abstract :
We present a framework to calculate the thermal resistance of Au-Sn eutectic solder joint (Rth, Au-Sn joint) in high brightness light emitting diode (HB LED) packages whose heat extraction capability controls the optical efficiency and reliability of HB LEDs. Using the transient thermal measurement combined with the structure function based analytical method and the finite element method, we find that the thermal conductivity (k) of the thin solder joint becomes significantly smaller than the Au-Sn alloy after joining; hence, Rth, Au-Sn joint constitutes a large portion of the total Rth of the package (Rth PKG).
Keywords :
brightness; electronics packaging; finite element analysis; light emitting diodes; semiconductor device reliability; solders; thermal conductivity; HB LEDs; finite element method; heat extraction; high brightness light emitting diode packages; optical efficiency; reliability; solder joints; thermal conductivity; thermal resistance; transient thermal measurement; Finite element method; LED package; structure function; thermal resistance;
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
DOI :
10.1109/TCAPT.2009.2033414