Title :
Dielectric breakdown strength correlation with time-to-failure during wet aging of XLPE-insulated cables
Author :
Walton, Mark D. ; Bernstein, Bruce S. ; Thue, William A. ; Smith, John T., III
Author_Institution :
BICC Cables Ltd., Wrexham, UK
fDate :
7/1/1999 12:00:00 AM
Abstract :
This paper reviews two sets of failure information, the GMTF (a parameter obtained from time-to-failure results) and GMBD stress (a parameter that is calculated from AC breakdown test results), and suggests a correlation. The test results were obtained from accelerated aging experiments on full-sized medium voltage cables in carefully controlled and monitored water-filled tanks. Results show that the ambient temperature AC breakdown strength for equivalently aged cables is influenced primarily by voltage stress during aging-not by the aging temperature. The AC breakdown strength on equivalently aged cables was also shown to decrease with reductions in the aging voltage at all aging temperatures
Keywords :
XLPE insulation; ageing; electric breakdown; electric strength; failure analysis; insulation testing; power cable insulation; power cable testing; AC breakdown test; XLPE-insulated cables; accelerated aging; aging temperatures; aging voltage; ambient temperature AC breakdown strength; dielectric breakdown strength correlation; equivalently aged cables; failure information; full-sized medium voltage cables; geometric mean breakdown; geometric mean time-to-failure; voltage stress; water-filled tanks; wet aging; Accelerated aging; Breakdown voltage; Cables; Dielectric breakdown; Electric breakdown; Medium voltage; Stress; Temperature; Testing; Voltage control;
Journal_Title :
Power Delivery, IEEE Transactions on