Title :
Autocorrelation properties of the Thue-Morse sequence and their use in synchronization
Author :
Yarlagadda, Rao ; Hershey, John E.
Author_Institution :
Sch. of Electr. & Comput. Eng., Oklahoma State Univ., Stillwater, OK, USA
fDate :
12/1/1990 12:00:00 AM
Abstract :
Further properties of the autocorrelation coefficients of the Thue-Morse sequence are developed which are then used to develop a novel, robust synchronization method. Its behavior is simulated over a highly degraded binary symmetric channel and uses for the synchronization method are proposed. The synchronization method has the potential to maintain synchronization at bit error rates up to 10%
Keywords :
binary sequences; correlation theory; synchronisation; Thue-Morse sequence; autocorrelation coefficients; autocorrelation properties; binary symmetric channel; bit error rates; synchronization; Autocorrelation; Bit error rate; Communications Society; Counting circuits; Degradation; Random processes; Research and development; Robustness;
Journal_Title :
Communications, IEEE Transactions on
