DocumentCode
15248
Title
Practical Routability-Driven Design Flow for Multilayer Power Networks Using Aluminum-Pad Layer
Author
Wen-Hsiang Chang ; Chao, Mango C.-T ; Shi-Hao Chen
Author_Institution
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Volume
22
Issue
5
fYear
2014
fDate
May-14
Firstpage
1069
Lastpage
1081
Abstract
This paper presents a novel framework to efficiently and effectively build a robust but routing-friendly multilayer power network under the IR-drop and electro-migration (EM) constraints. The proposed framework first considers the impact of the aluminum-pad layer and provides a conservative analytical model to determine the total metal width for each power layer that can meet the IR-drop and EM constraints. Then the proposed framework can identify an optimal irredundant stripe width by considering the number of occupied routing tracks and the potential routing detour caused by the power stripes without the information of cell placement. Next, after the cell placement is done, the proposed framework applies a dynamic-programming approach to further reduce the potential routing detour by relocating the power stripes. A series of experiments are conducted based on a 40 nm, 1.1 V, and 900-MHz microprocessor to validate the effectiveness and efficiency of the proposed framework.
Keywords
aluminium; distribution networks; dynamic programming; electromigration; microcomputers; network routing; Al; IR-drop constraints; aluminum-pad layer; cell placement; dynamic-programming approach; electro-migration constraints; frequency 900 MHz; microprocessor; multilayer power networks; practical routability-driven design flow; size 40 nm; total metal width; voltage 1.1 V; Electro-migration (EM); IR drop; power network; routing-driven; routing-driven.;
fLanguage
English
Journal_Title
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher
ieee
ISSN
1063-8210
Type
jour
DOI
10.1109/TVLSI.2013.2264686
Filename
6549125
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