DocumentCode
1524900
Title
A model for the high-level description and simulation of VLSI networks
Author
van der Hoeven, A.J. ; de Lange, A.A.J. ; Deprettere, E.F. ; Dewilde, P.M.
Author_Institution
Delft Univ. of Technol., Netherlands
Volume
10
Issue
4
fYear
1990
Firstpage
41
Lastpage
48
Abstract
An applicative state transition (AST) model for the description and analysis of synchronous and asynchronous VLSI networks at the top levels of abstraction is presented. The model, which uses two powerful paradigms that provide an elegant, fast method for the high-level description and simulation of VLSI networks, explicitly represents the flow of information through a network. This is done by embedding the AST concept into the theory of Petri nets and using Petri net theory to define the communication protocol between nodes. It allows the description of both synchronous and asynchronous designs from the level of abstract functional or algorithmic behaviour down to the register-transfer level. In design descriptions, the model logically separates state, function, and function control, increasing the clearness of the description and simplifying the development and application of silicon compilers. As an application the design of a simple priority queue as both a real-time systolic (synchronous) system and a real-time wavefront (asynchronous) system is explored. This example demonstrates the capability of the AST graph model to handle loops in the design. The model has been embedded in an interactive design system called HIFI (Hierarchical Interactive Flowgraph Integration).<>
Keywords
VLSI; circuit analysis computing; HIFI; Petri nets; VLSI networks; abstract functional; algorithmic behaviour; applicative state transition; communication protocol; embedding; graph model; high-level description; interactive design system; model; priority queue; real-time systolic; real-time wavefront; register-transfer level; silicon compilers; simulation; Algorithm design and analysis; Computer languages; Delay; Hardware; Silicon compiler; Very large scale integration;
fLanguage
English
Journal_Title
Micro, IEEE
Publisher
ieee
ISSN
0272-1732
Type
jour
DOI
10.1109/40.57730
Filename
57730
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