Author :
Kang, Tae-Weon ; Kim, Wan-Soo
Author_Institution :
Korea Research Institute of Standards and Science, Daejeon, Korea
fDate :
7/1/2011 12:00:00 AM
Abstract :
The 93 papers in this special issue are extended versions of papers presented at the 2010 Conference on Precision Electromagnetic Measurements (CPEM), held in Daejeon, Korea, from June 13 to 18.
Keywords :
Electromagnetic measurements; Meetings; Special issues and sections;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2011.2138970
