DocumentCode :
1525818
Title :
Magnetic properties of FeCoV film sandwiched by thin soft-magnetic films
Author :
Nozawa, Tadao ; Nouchi, Norimoto ; Morimoto, Fumio
Author_Institution :
Dept. of Electr. Eng., Kyushu Kyoritsu Univ., Fukuoka, Japan
Volume :
37
Issue :
4
fYear :
2001
fDate :
7/1/2001 12:00:00 AM
Firstpage :
3033
Lastpage :
3038
Abstract :
Soft magnetization of FeCoV thin films has been examined experimentally. The coercive force of FeCoV films decreases by more than 90% with little reduction in saturation magnetization or changes in magnetization behavior when films are sandwiched between two thin FeNiMo soft-magnetic layers making up about 2% of the total volume. It can be assumed that a magnetic wall, parallel to the film surface and formed at the interface between the soft-magnetic layer and the FeCoV layer, will readily propagate into the FeCoV layer. The thickness of the soft-magnetic layer necessary for the magnetic wall formation is thought to be about 50~100 Å. The reduction in coercive force seems to be related to the anisotropy of the magnetic properties of the thin soft-magnetic layer. In the case of Fe films, however, a reduction in coercive force due to the thin soft-magnetic layer never occurs. Whether the thin soft-magnetic layer has effects on the crystal structure of FeCoV or Fe layers, will be examined experimentally in the future
Keywords :
cobalt alloys; coercive force; iron alloys; magnetic anisotropy; magnetic domain walls; magnetic thin films; magnetisation; soft magnetic materials; vanadium alloys; FeCoV; FeCoV thin film; coercive force; magnetic anisotropy; magnetic domain wall; magnetic properties; magnetization; sandwich structure; saturation magnetization; soft magnetic layer; soft magnetization; Anisotropic magnetoresistance; Coercive force; Iron; Magnetic anisotropy; Magnetic films; Magnetic properties; Perpendicular magnetic anisotropy; Saturation magnetization; Soft magnetic materials; Transistors;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.947058
Filename :
947058
Link To Document :
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