DocumentCode :
1526386
Title :
Silicon bipolar IC for PRBS testing generates adjustable bit rates up to 25 Gbit/s
Author :
Schumann, F. ; Bock, J.
Author_Institution :
Corp. Technol., Siemens AG, Munich, Germany
Volume :
33
Issue :
24
fYear :
1997
fDate :
11/20/1997 12:00:00 AM
Firstpage :
2022
Lastpage :
2023
Abstract :
For the first time, a completely integrated pseudo-random pattern generator providing adjustable bit rates up to at least 25 Gbit/s without additional external multiplexing is presented. The sequence length is 2n-1. The application of the monolithic Si bipolar IC serves as a single chip measurement instrument for pseudo-random binary sequence (PRBS) generation required for the characterisation and development of high-speed components used in future optical fibre communication systems. Only three external microwave components are needed for operation: a clock generator, a power divider and a phase shifter. The chip is realised in an advanced implanted base silicon bipolar technology
Keywords :
binary sequences; bipolar digital integrated circuits; elemental semiconductors; function generators; optical communication equipment; random number generation; silicon; telecommunication equipment testing; test equipment; 25 Gbit/s; PRBS testing; Si; Si bipolar IC; adjustable bit rates; clock generator; external microwave components; high-speed components; implanted base bipolar technology; monolithic IC; optical fibre communication systems; phase shifter; power divider; pseudo-random pattern generator; single chip measurement instrument;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19971366
Filename :
648233
Link To Document :
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