Silicon bipolar IC for PRBS testing generates adjustable bit rates up to 25 Gbit/s

Author

Schumann, F. ; Bock, J.

Author_Institution

Corp. Technol., Siemens AG, Munich, Germany

Volume

33

Issue

24

fYear

1997

fDate

11/20/1997 12:00:00 AM

Firstpage

2022

Lastpage

2023

Abstract

For the first time, a completely integrated pseudo-random pattern generator providing adjustable bit rates up to at least 25 Gbit/s without additional external multiplexing is presented. The sequence length is 2ⁿ-1. The application of the monolithic Si bipolar IC serves as a single chip measurement instrument for pseudo-random binary sequence (PRBS) generation required for the characterisation and development of high-speed components used in future optical fibre communication systems. Only three external microwave components are needed for operation: a clock generator, a power divider and a phase shifter. The chip is realised in an advanced implanted base silicon bipolar technology

Keywords

binary sequences; bipolar digital integrated circuits; elemental semiconductors; function generators; optical communication equipment; random number generation; silicon; telecommunication equipment testing; test equipment; 25 Gbit/s; PRBS testing; Si; Si bipolar IC; adjustable bit rates; clock generator; external microwave components; high-speed components; implanted base bipolar technology; monolithic IC; optical fibre communication systems; phase shifter; power divider; pseudo-random pattern generator; single chip measurement instrument;

fLanguage

English

Journal_Title

Electronics Letters

Publisher

iet

ISSN

0013-5194

Type

jour

DOI

10.1049/el:19971366

Filename

648233