• DocumentCode
    1526493
  • Title

    Accurate Temperature Estimation Using Noisy Thermal Sensors for Gaussian and Non-Gaussian Cases

  • Author

    Zhang, Yufu ; Srivastava, Ankur

  • Author_Institution
    Electr. & Comput. Eng. Dept., Univ. of Maryland, College Park, MD, USA
  • Volume
    19
  • Issue
    9
  • fYear
    2011
  • Firstpage
    1617
  • Lastpage
    1626
  • Abstract
    Multicore system-on-chips (SOCs) rely on runtime thermal monitoring using on-chip thermal sensors for dynamic thermal management (DTM). However, on-chip sensors are highly susceptible to noise due to fabrication randomness, VDD fluctuations, etc. This causes discrepancy between the actual temperature and the one observed by thermal sensor. In this paper, we address the problem of estimating the accurate temperature of on-chip thermal sensor when the sensor reading has been corrupted by noise. We present statistical techniques for the following: 1) when the underlying randomness exhibits jointly-Gaussian characteristics we present the optimal solution for temperature estimation; 2) for close to Gaussian cases we give a heuristic based on Moment Matching; 3) when the underlying randomness is non-Gaussian a hypothesis testing framework is used to predict the sensor temperatures. The previous three techniques are investigated in both single sensor and multisensor scenarios, respectively. The latter tries to estimate the actual temperatures for several sensors simultaneously while exploiting the correlations in temperature and circuit parameters among different sensors. The experiments showed that using our estimation schemes the root mean square (RMS) error can be reduce (with very small runtime overhead) by 71.5% as compared to blindly trusting the sensors to be noise-free.
  • Keywords
    statistical analysis; system-on-chip; temperature sensors; thermal management (packaging); DTM; RMS error; SOC; accurate temperature estimation; dynamic thermal management; moment matching; multicore system-on-chips; noisy thermal sensors; nonGaussian cases; on-chip thermal sensors; root mean square error; runtime thermal monitoring; statistical techniques; Gaussian noise; Monitoring; Multicore processing; Runtime; Sensor phenomena and characterization; System-on-a-chip; Temperature distribution; Temperature sensors; Thermal management; Thermal sensors; Dynamic thermal management (DTM); estimation; on-chip sensor; temperature;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2010.2051567
  • Filename
    5497219