Title :
Constant high-speed optical low-coherence reflectometry over 0.12 m scan range
fDate :
11/20/1997 12:00:00 AM
Abstract :
A constant high-speed optical low-coherence reflectometer is presented. The use of both the reference and sample arms as delay lines results in highly linear optical path length changes. Scan speeds of up to 96 m/s are maintained over a range of typically 100 mm with a speed variation of only 0.1%
Keywords :
high-speed optical techniques; optical delay lines; reflectometry; 0.12 m; 96 m/s; constant high-speed optical low-coherence reflectometry; delay line; linear optical path length; scan range;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19971358
