DocumentCode :
1526630
Title :
A critical note to IEEE 1057-94 standard on hysteretic ADC dynamic testing
Author :
Arpaia, P.
Author_Institution :
Dipt. di Ingegneria Elettrica, Naples Univ.
Volume :
50
Issue :
4
fYear :
2001
fDate :
8/1/2001 12:00:00 AM
Firstpage :
941
Lastpage :
948
Abstract :
In recent gears, the IEEE 1057-93 Standard (1994) for specifying and testing measurement devices based on analog-to-digital converters (ADCs) earned scientific interest in several topics. In particular, investigations showed the histogram test of the standard to be insensitive to ADC hysteresis. In this paper, an alternative test procedure for determining the dynamic transfer function of an ADC with hysteresis is proposed. The procedure exploits digital signal processing to reduce the large amount of data required by the histogram test. Numerical and experimental results of performance characterization, comparison with a state-of-the-art procedure, and noise-sensitivity analysis are presented and discussed
Keywords :
IEEE standards; analogue-digital conversion; hysteresis; integrated circuit testing; numerical analysis; IEEE 1057-94 standard; analog-to-digital converters; digital signal processing; dynamic transfer function; experimental results; histogram test; hysteretic ADC dynamic testing; noise-sensitivity analysis; numerical results; performance; Analog-digital conversion; Digital signal processing; Histograms; Hysteresis; Measurement standards; Standardization; Telecommunication computing; Testing; Transfer functions; World Wide Web;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.948304
Filename :
948304
Link To Document :
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