Title :
Measuring mixed-signal substrate coupling
Author :
Rolain, Yves ; Van Moer, Wendy ; Vandersteen, Gerd ; Van Heijningen, Marc
Author_Institution :
Dept. of Electr. Meas., Vrije Univ., Brussels, Belgium
fDate :
8/1/2001 12:00:00 AM
Abstract :
A measurement method is proposed to characterize the substrate coupling between digital and analog sections of a mixed-signal CMOS chip. Induced noise and spurious signals can be measured by a custom-designed analog sensor. This paper proposes a method that, when given such a sensor, allows to measure the crosstalk between digital and analog chip sections. Calibrated sampling scope measurements illustrate the performance of the measurement setup
Keywords :
CMOS integrated circuits; calibration; crosstalk; electric noise measurement; mixed analogue-digital integrated circuits; network analysers; substrates; time-domain analysis; waveform analysis; calibrated sampling; crosstalk; custom-designed analog sensor; mixed-signal CMOS chip; mixed-signal substrate coupling; substrate coupling; Crosstalk; Differential amplifiers; Integrated circuit measurements; Inverters; Noise measurement; Pollution measurement; Sampling methods; Semiconductor device measurement; Sensor phenomena and characterization; Testing;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
