Title :
Fabrication of double sided YBa/sub 2/Cu/sub 3/O/sub 7/ thin films on 2 inch diameter LaAlO/sub 3/ wafers by direct wafer bonding
Author :
Eom, C.B. ; Huang, L. ; Rao, R.A. ; Tong, Q.Y. ; Goesele, U.
Author_Institution :
Dept. of Mech. Eng. & Mater. Sci., Duke Univ., Durham, NC, USA
fDate :
6/1/1997 12:00:00 AM
Abstract :
We have demonstrated a novel fabrication process for double-sided YBa/sub 2/Cu/sub 3/O/sub 7/ (YBCO) thin films on 2 inch diameter (100) LaAlO/sub 3/ wafers by direct wafer bonding. YBCO thin films were deposited on one side of two LaAlO/sub 3/ wafers by a 90/spl deg/ off-axis sputtering technique. These two LaAlO/sub 3/ wafers were then polished on the opposite side and directly bonded at room temperature. We have also developed and optimized the process of LaAlO/sub 3/ wafer bonding. The effect of annealing on the roughness, twin structure and bonding strength of bonded LaAlO/sub 3/ wafers has been investigated. After annealing at 120/spl deg/C for 100 hours, the bonded LaAlO/sub 3/ pairs remained intact even after immersion in deionized water for 20 hours. This process can be used for fabricating double sided high temperature superconducting thin films on heterostructure substrates, which have important applications in high frequency devices.
Keywords :
annealing; barium compounds; high-temperature superconductors; sputtered coatings; superconducting thin films; surface structure; wafer bonding; yttrium compounds; 100 h; 120 C; 2 in; 2 inch diameter LaAlO/sub 3/ wafers; 20 h; 90/spl deg/ off-axis sputtering technique; LaAlO/sub 3/; YBa/sub 2/Cu/sub 3/O/sub 7/; annealing; bonding strength; direct wafer bonding; double sided YBa/sub 2/Cu/sub 3/O/sub 7/ thin films; fabrication process; high temperature superconductor; roughness; twin structure; Dielectric thin films; Fabrication; High temperature superconductors; Rough surfaces; Sputtering; Substrates; Superconducting microwave devices; Transistors; Wafer bonding; Yttrium barium copper oxide;
Journal_Title :
Applied Superconductivity, IEEE Transactions on