Title :
Residual surface resistance of YBa/sub 2/Cu/sub 3/O/sub x/ thin films-weakly coupled grain model
Author :
Yoshida, K. ; Nagasawa, K. ; Kiss, T. ; Shimakage, H. ; Wang, Z.
Author_Institution :
Dept. of Electron. Device Eng., Kyushu Univ., Fukuoka, Japan
fDate :
6/1/1997 12:00:00 AM
Abstract :
The residual surface resistance and the magnetic penetration depth of high-T/sub c/ superconducting YBa/sub 2/Cu/sub 3/O/sub x/ thin films have been measured using the coplanar waveguide resonator technique, and are discussed with the weakly coupled grain model, where the superconducting polycrystalline thin film is described as a network of superconducting grains coupled via Josephson junctions. The observed dependence of the residual resistance and the magnetic penetration depth on the critical current density and the grain size is shown to demonstrate the weakly coupled grain model of YBa/sub 2/Cu/sub 3/O/sub x/ thin films.
Keywords :
Josephson effect; barium compounds; critical current density (superconductivity); grain size; high-temperature superconductors; penetration depth (superconductivity); superconducting thin films; surface conductivity; yttrium compounds; Josephson junctions; YBa/sub 2/Cu/sub 3/O/sub 7/; YBa/sub 2/Cu/sub 3/O/sub x/ thin films; coplanar waveguide resonator technique; critical current density; grain size; high temperature superconductors; magnetic penetration depth; residual surface resistance; superconducting grains; superconducting polycrystalline thin film; weakly coupled grain model; Coplanar waveguides; Couplings; Electrical resistance measurement; Josephson junctions; Magnetic films; Superconducting magnets; Superconducting thin films; Surface resistance; Surface waves; Waveguide junctions;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
