A hysteresis model for a vanadium dioxide transition-edge microbolometer

Author

De Almeida, Luiz Alberto Luz ; Deep, Gurdip Singh ; Lima, Antonio Marcus Nogueira ; Neff, Helmut Franz ; Freire, Raimundo Carlos Silvério

Author_Institution

Dept. de Engenharia Eletrica, Univ. Fed. da Paraiba, Joao Pessoa, Brazil

Volume

50

Issue

4

fYear

2001

fDate

8/1/2001 12:00:00 AM

Firstpage

1030

Lastpage

1035

Abstract

This paper presents the adaptation of the Preisach model, originally developed for magnetic hysteresis, to describe mathematically the hysteresis in the resistance-temperature characteristics of vanadium-dioxide (VO₂) thin film radiation sensors. The necessary and sufficient conditions for the applicability of the Preisach model to a VO₂ film sensor are experimentally verified. Experimentally measured characteristics are compared with those given by the model for minor and major loops

Keywords

bolometers; hysteresis; metal-insulator transition; thin film devices; vanadium compounds; Preisach model adaptation; VO₂; hysteresis model; major loops; metal-insulator transition; minor loops; resistance-temperature characteristics; thin film radiation sensors; transition-edge microbolometer; Bolometers; Magnetic films; Magnetic hysteresis; Magnetic sensors; Mathematical model; Metal-insulator structures; Sensor phenomena and characterization; Temperature sensors; Thermal sensors; Thin film sensors;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.948321

Filename

948321