DocumentCode :
1526855
Title :
Nondestructive method for measuring the coupling between optical waveguides
Author :
Brooks, David ; Ruschin, Shlomo ; Scarlat, Dan
Author_Institution :
Fac. of Eng., Tel Aviv Univ., Israel
Volume :
2
Issue :
2
fYear :
1996
fDate :
6/1/1996 12:00:00 AM
Firstpage :
210
Lastpage :
214
Abstract :
A new method for direct measurement of the coupling coefficient between parallel and identical optical waveguides is presented. The method is based on imaging and recording the field emerging at the output facet of the device, while the excitation at the input facet is performed by illuminating it with a planar wavefront. The angle of incidence of the wavefront is scanned with respect to the input facet. A useful and simple relationship exists between the coefficients of the normal-modes excited by this procedure and the spatial Fourier Transform of these modes. From this relationship, the coupling coefficients are readily deduced. Only one pair of coupled guides running from facet-to facet is required for characterization. The method is nondestructive, simple, and requires a microcomputer assisted CCD camera and minimal standard optical equipment. The coupling coefficient of two nearby Ti indiffused LiNbO3 waveguides was experimentally measured by this technique and the results were compared to those furnished by other methods
Keywords :
Fourier transform optics; integrated optics; optical couplers; optical testing; optical waveguides; titanium; LiNbO3:Ti; Ti indiffused LiNbO3 waveguides; angle of incidence; coupling coefficient; field imaging; field recording; integrated optic devices; microcomputer assisted CCD camera; nondestructive method; normal-mode coefficients; optical waveguide coupling; parallel optical waveguides; planar wavefront illumination; spatial Fourier transform; Couplers; Fabrication; Length measurement; Optical coupling; Optical devices; Optical recording; Optical sensors; Optical waveguides; Strips; Titanium;
fLanguage :
English
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
1077-260X
Type :
jour
DOI :
10.1109/2944.577362
Filename :
577362
Link To Document :
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