Title :
Determination of an optimum set of testable components in the fault diagnosis of analog linear circuits
Author :
Fedi, Giulio ; Manetti, Stefano ; Piccirilli, Maria Cristina ; Starzyk, Janusz
Author_Institution :
Dept. of Electron. Eng., Florence Univ., Italy
fDate :
7/1/1999 12:00:00 AM
Abstract :
A procedure for the determination of an optimum set of testable components in the fault diagnosis of analog linear circuits is presented. The proposed method has its theoretical foundation in the testability concept and in the canonical ambiguity group concept. New considerations relevant to the existence of unique solution in the k-fault diagnosis problem of analog linear circuits are presented, and examples of application of the developed procedure are considered by exploiting a software package based on symbolic analysis techniques
Keywords :
analogue integrated circuits; automatic testing; fault diagnosis; integrated circuit testing; network parameters; analog linear circuits; canonical ambiguity group; k-fault diagnosis problem; software package; symbolic analysis techniques; testable components; Application software; Circuit faults; Circuit testing; Fault diagnosis; Fault location; Linear circuits; Nonlinear equations; Software packages; Software prototyping; System testing;
Journal_Title :
Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on
