• DocumentCode
    1527176
  • Title

    Influence of the field orientation on the critical current density of Nb/sub 3/Sn strands

  • Author

    Schild, T. ; Duchateau, J.L. ; Ciazynski, D.

  • Author_Institution
    CE Cadarache, Assoc. Euratom-CEA/DRFC, St. Paul-lez-Durance, France
  • Volume
    7
  • Issue
    2
  • fYear
    1997
  • fDate
    6/1/1997 12:00:00 AM
  • Firstpage
    1512
  • Lastpage
    1515
  • Abstract
    In many applications using superconducting cables such as tokamaks for fusion, the angle between the strand axis and the applied field can take values different than 90/spl deg/. Estimating the critical current value for any angles knowing only its value for the well-known perpendicular orientation at a given field, is very useful. A model is presented that could achieve, for a given material, such a result thanks to an intrinsic parameter, called the anisotropy parameter, defined as the ratio of the axial critical current in a perpendicular field to the azimutal critical current In a parallel background field. To check the model for Nb3Sn, this parameter has been measured on Nb/sub 3/Sn untwisted strands. We used two methods: one based on magnetic measurements and the other on critical current measurements with several field orientations and strengths. Unexpectedly an anisotropy of the critical current density as a function of the field orientation has been pointed out in these measurements.
  • Keywords
    critical current density (superconductivity); niobium alloys; superconducting cables; superconducting materials; tin alloys; Nb/sub 3/Sn; Nb/sub 3/Sn strands; anisotropy parameter; axial critical current; critical current density; field orientation; perpendicular orientation; superconducting cables; Anisotropic magnetoresistance; Critical current; Critical current density; Current measurement; Magnetic field measurement; Niobium; Niobium-tin; Superconducting cables; Tin; Tokamaks;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.620860
  • Filename
    620860