• DocumentCode
    1527313
  • Title

    High-extinction ratio and low-loss silica-based 8×8 strictly nonblocking thermooptic matrix switch

  • Author

    Goh, Takashi ; Himeno, Akira ; Okuno, Masayuki ; Takahashi, Hiroshi ; Hattori, IKuninori

  • Author_Institution
    NTT Photonics Labs., Ibaraki, Japan
  • Volume
    17
  • Issue
    7
  • fYear
    1999
  • fDate
    7/1/1999 12:00:00 AM
  • Firstpage
    1192
  • Lastpage
    1199
  • Abstract
    This paper describes a silica-based 8×8 strictly nonblocking thermooptic matrix switch with a high-extinction ratio and low loss. We realized this matrix switch by using a configuration which combines a double Mach-Zehnder interferometer (MZI) switching unit and an N×N matrix arrangement thus reducing the total waveguide length. The 8×8 matrix switch was fabricated on a 4-in wafer using planar lightwave circuit technology. We obtained an average extinction ratio of 60.3 dB and an average insertion loss of 5.1 dB. The operating wavelength bandwidth completely covers the gain band of practical erbium-doped fiber amplifiers (EDFAs)
  • Keywords
    Mach-Zehnder interferometers; electro-optical switches; integrated optics; integrated optoelectronics; optical communication equipment; optical fabrication; optical losses; silicon compounds; thermo-optical effects; 5.1 dB; 8×8 matrix switch; EDFA; N×N matrix arrangement; average extinction ratio; average insertion loss; configuration; double Mach-Zehnder interferometer switching unit; erbium-doped fiber amplifiers; gain band; high-extinction ratio; low-loss silica-based 8×8 strictly nonblocking thermooptic matrix switch; operating wavelength bandwidth; planar lightwave circuit technology; total waveguide length; Communication switching; Extinction ratio; Insertion loss; Optical crosstalk; Optical interferometry; Optical planar waveguides; Optical switches; Optical waveguides; Planar waveguides; Transmission line matrix methods;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/50.774253
  • Filename
    774253