DocumentCode :
1527469
Title :
System Test Standards Committee Meeting
Author :
Greenspan, Arnold M.
Author_Institution :
AESS
Volume :
12
Issue :
2
fYear :
1997
Firstpage :
12
Lastpage :
13
Keywords :
Aerospace and Electronic Systems Society; Aerospace electronics; Automatic test pattern generation; Automatic testing; Project management; Standards Board; Standards Coordinating Committees; Standards development; System testing; Test equipment;
fLanguage :
English
Journal_Title :
Aerospace and Electronic Systems Magazine, IEEE
Publisher :
ieee
ISSN :
0885-8985
Type :
jour
DOI :
10.1109/MAES.1997.577431
Filename :
577431
Link To Document :
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