DocumentCode :
1527587
Title :
Time evolution of hollow cathode ionization processes in the final breakdown phase of a transient hollow cathode discharge
Author :
Zambra, Marcelo ; Favre, Mario ; Moreno, José ; Chuaqui, Hernán ; Wyndham, Edmund ; Choi, Peter
Author_Institution :
Comision Chilena de Energia Nucl., Santiago, Chile
Volume :
27
Issue :
3
fYear :
1999
fDate :
6/1/1999 12:00:00 AM
Firstpage :
746
Lastpage :
751
Abstract :
The enhanced ionization processes taking place inside the hollow cathode region (HCR) of a transient hollow cathode discharge (THCD) are essential events which lead to final electrical breakdown. This ionization growth is permanently assisted by a virtual anode moving in the anode-cathode gap (A-K gap), which extends the anode potential to within the hollow cathode region. In the paper, the ionization growth inside the HCR under the enhanced field due to the close proximity of the anode potential has been studied using a statistical technique in a range of pressures, with three different cathode apertures. Statistical time distributions of an extensive experimental data set are analyzed to understand the mechanisms involved in the final stages, just before electric breakdown
Keywords :
anodes; cathodes; glow discharges; ionisation; plasma diagnostics; plasma probes; A-K gap; anode potential; anode-cathode gap; cathode apertures; electric breakdown; enhanced field; enhanced ionization processes; final breakdown phase; final electrical breakdown; hollow cathode ionization processes; hollow cathode region; ionization growth; statistical technique; statistical time distributions; transient hollow cathode discharge; virtual anode; Anodes; Apertures; Cathodes; Data analysis; Discharges; Electric breakdown; Electron beams; Gaussian distribution; Geometry; Ionization;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/27.774678
Filename :
774678
Link To Document :
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