DocumentCode :
1527929
Title :
A reliable and environmentally friendly packaging technology-flip-chip joining using anisotropically conductive adhesive
Author :
Liu, Johan ; Tolvgård, Arne ; Malmodin, Jens ; Lai, Zonghe
Author_Institution :
Swedish Inst. of Production Eng. Res., Molndal, Sweden
Volume :
22
Issue :
2
fYear :
1999
fDate :
6/1/1999 12:00:00 AM
Firstpage :
186
Lastpage :
190
Abstract :
There is an increasing demand to move the radio base station closer to the antenna for future mobile telecommunication systems. This requires a significant reduction in weight and volume and increased environmental compatibility. This work provides an evaluation of environmental impact and reliability when using anisotropically conductive adhesives (ACA) for flip-chip joining in radio base station applications. Conventional FR-4 substrate has been used to assemble a digital ASIC chip using an anisotropically conductive adhesive and flip-chip technology. The chip has a minimum pitch of 128 μm with 7.8 mm in chip 8 and has in total 144 bumps with a bump size of 114×126 μm2. Bumping was made using electroless nickel/gold technology. Bonding quality has been characterized by optical and scanning electron microscopy and substrate planarity measurement. The main parameters affecting quality are misalignment and softening of the FR-4 substrate during assembly, leading to high joint resistance. Reliability testing was conducted in the form of a temperature cycling test between -40 and ±125°C for 1000 cycles, a 125°C aging test for 100 h and a 85/85 humidity test for 500 h. The results show that relatively small resistance changes were observed after the reliability test. The environmental impact evaluation was done in the form of a material content declaration and a life cycle assessment (LCA). By using flip-chip ACA joining technology, the content of environmentally risky materials has been reduced more than ten times, and the use of precious metals has been reduced more than 30 times compared to conventional surface mount technology
Keywords :
adhesives; application specific integrated circuits; electroless deposition; environmental factors; flip-chip devices; integrated circuit packaging; integrated circuit reliability; life testing; optical microscopy; scanning electron microscopy; -40 to 125 degC; 100 h; 128 micron; 500 h; FR-4 substrate; Ni-Au; anisotropically conductive adhesive; bonding quality; bump size; digital ASIC chip; electroless technology; environmental impact evaluation; environmentally friendly packaging technology; environmentally risky materials; flip-chip joining; joint resistance; life cycle assessment; material content declaration; misalignment; optical microscopy; radio base station applications; reliability testing; scanning electron microscopy; substrate planarity measurement; Anisotropic magnetoresistance; Application specific integrated circuits; Assembly; Base stations; Conductive adhesives; Mobile antennas; Optical microscopy; Packaging; Surface-mount technology; Testing;
fLanguage :
English
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3331
Type :
jour
DOI :
10.1109/6144.774729
Filename :
774729
Link To Document :
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