DocumentCode :
1527951
Title :
Parametric dependence of fatigue of electronic adhesives
Author :
Gladkov, Alex ; Bar-Cohen, Avram
Author_Institution :
Minnesota Univ., Minneapolis, MN, USA
Volume :
22
Issue :
2
fYear :
1999
fDate :
6/1/1999 12:00:00 AM
Firstpage :
200
Lastpage :
208
Abstract :
Adhesives used in electronic applications are subject to high cyclic shear stresses resulting from differential thermal expansion of the bonded materials. In this study, an attempt has been made to experimentally determine the dependence of the fatigue life of two packaging epoxy adhesives on: temperature, peak cycling stress as a fraction of adhesion strength, and cyclic frequency. Both epoxies were used to bond surfaces of aluminum and silicon. Tensile lap-shear specimens were used
Keywords :
adhesives; fatigue; packaging; reliability; thermal expansion; adhesion strength; cyclic shear stresses; differential thermal expansion; electronic adhesives; epoxy adhesives; fatigue life; packaging; peak cycling stress; tensile lap-shear specimens; Adhesives; Aluminum; Bonding; Electronic packaging thermal management; Fatigue; Frequency; Temperature dependence; Tensile stress; Thermal expansion; Thermal stresses;
fLanguage :
English
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3331
Type :
jour
DOI :
10.1109/6144.774732
Filename :
774732
Link To Document :
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