DocumentCode :
1528023
Title :
Metallurgical considerations for accelerated testing of soft solder joints
Author :
Grossmann, Georg ; Weber, Ludger
Author_Institution :
Reliability Lab., Swiss Federal Inst. of Technol., Zurich, Switzerland
Volume :
20
Issue :
3
fYear :
1997
fDate :
7/1/1997 12:00:00 AM
Firstpage :
213
Lastpage :
218
Abstract :
The development of new packages as well as the ongoing miniaturization in surface mount technology (SMT) make the evaluation of the reliability of solder joints a permanent task. Accelerated testing, especially passive thermal cycling, is a important tool to assess the lifetime of solder joints. However, tin-lead solder behaves viscoplastically even at ambient temperature because of its low melting point and therefore the temperature extremes and the temperature swing of the tests performed as well as the temperature change rate are very important parameters for testing. Different deformation rates cause different deformation mechanisms to occur. Therefore it is crucial to take the metallurgical behavior of tin-lead solder into account when accelerated tests are to be performed. However, many accelerated test designs in industry do not at all care for this fact. (1) Temperature shock chambers are used in order to shorten the test time activating deformation mechanisms that do not occur in reality. (2) Test chambers are overloaded, test specimen with high mass are tested or the specimen are placed with varying orientations to the air stream of the chamber not caring about temperatures and temperature gradients occurring in the solder joints
Keywords :
circuit reliability; creep testing; dislocation climb; lead alloys; life testing; printed circuit testing; recrystallisation; silver alloys; slip; soldering; surface mount technology; thermal stress cracking; tin alloys; Sn-Pb solder; Sn62Pb36Ag2; SnPbAg; accelerated testing; crack length; creep mechanisms; deformation rates; dislocation climb; grain boundary sliding; metallurgical considerations; passive thermal cycling; recrystallization; shear test; soft solder joints; solder joint reliability; surface mount technology; temperature gradients; temperature shock chambers; test chamber overloading; Capacitive sensors; Circuit testing; Creep; Grain boundaries; Life estimation; Packaging; Performance evaluation; Soldering; Surface-mount technology; Temperature;
fLanguage :
English
Journal_Title :
Components, Packaging, and Manufacturing Technology, Part C, IEEE Transactions on
Publisher :
ieee
ISSN :
1083-4400
Type :
jour
DOI :
10.1109/3476.649443
Filename :
649443
Link To Document :
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