DocumentCode :
1528063
Title :
Electroless remetallization of aluminum bond pads on CMOS driver chip for flip-chip attachment to vertical cavity surface emitting lasers (VCSEL´s)
Author :
Datta, Madhumita ; Merritt, Scott A. ; Dagenais, Mario
Author_Institution :
Dept. of Electr. Eng., Maryland Univ., College Park, MD, USA
Volume :
22
Issue :
2
fYear :
1999
fDate :
6/1/1999 12:00:00 AM
Firstpage :
299
Lastpage :
306
Abstract :
A method for remetallizing the bond pads of electronic chips, which are initially metallized with aluminum or aluminum alloy is presented. Application of electroless plating process for the remetallization of aluminum to a solderable gold surface can reduce the cost and complication of the widely accepted flip-chip interconnection technology. We have developed a step by step nickel/gold wafer bumping technique (remetallized bump height is 5.0 μm) for the appropriate solder (15.0 μm of In:Pb). Variation of roughness of the remetallized surface has been studied carefully. We have completed prototype research studies on test devices and successfully packaged the flip-chip bonded hybrid pair of a CMOS driver chip and a dummy structure of vertical cavity surface emitting laser (VCSEL) array. Cross section of the flip-chip solder joint is studied. Also, adhesion strength of the metal deposit is investigated
Keywords :
CMOS integrated circuits; aluminium; driver circuits; electroless deposition; flip-chip devices; lead bonding; metallisation; semiconductor laser arrays; surface emitting lasers; Al; CMOS driver chip; In-Pb solder; Ni-Au; adhesion strength; aluminum bond pad; electroless remetallization; flip-chip interconnection; nickel/gold wafer bumping; packaging; surface roughness; vertical cavity surface emitting laser array; Aluminum alloys; Bonding; CMOS technology; Costs; Driver circuits; Gold; Metallization; Rough surfaces; Surface roughness; Vertical cavity surface emitting lasers;
fLanguage :
English
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3331
Type :
jour
DOI :
10.1109/6144.774749
Filename :
774749
Link To Document :
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