Characterization of interfacial growth between Bi(2212) and Ag coating

Author

Breitwisch, M.J. ; Kouzoudis, D. ; Ostenson, J.E. ; Finnemore, D.K. ; Balachandran, U.

Author_Institution

Dept. of Phys., Iowa State Univ., Ames, IA, USA

Volume

7

Issue

2

fYear

1997

fDate

6/1/1997 12:00:00 AM

Firstpage

1691

Lastpage

1694

Abstract

The growth of hillocks at the interface between Bi(2212) and Ag has been found to occur over a wide range of oxygen partial pressure and in the vicinity of 700/spl deg/C, a temperature far below the Bi(2212)-Bi(2223) conversion temperature. These hillocks have been examined by environmental scanning microscope (ESEM) and regular SEM in secondary and backscattering modes. Definitive chemical analysis is still an open question. The Ag is highly mobile at these temperatures.

Keywords

bismuth compounds; calcium compounds; composite material interfaces; electron backscattering; high-temperature superconductors; interface structure; scanning electron microscopy; secondary electron emission; silver; strontium compounds; superconducting tapes; surface diffusion; 700 C; Ag coating; Bi(2212); Bi(2212)-Bi(2223) conversion temperature; Bi/sub 2/Sr/sub 2/CaCu/sub 2/O-Ag; ESEM; HTSC tapes; backscattering modes; chemical analysis; environmental scanning microscopy; highly mobile Ag; hillocks; interfacial growth; oxygen partial pressure; regular SEM; secondary modes; Backscatter; Coatings; Fabrication; Furnaces; Laboratories; Physics; Powders; Scanning electron microscopy; Temperature distribution; X-rays;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.620904

Filename

620904