Title :
YBCO thick films for high Q resonators
Author :
Smith, P.A. ; Button, T.W. ; Holmes, J. ; Dolman, G. ; Meggs, C. ; Remillard, S.K. ; Hodge, J.D.
Author_Institution :
IRC in Mater., Birmingham Univ., UK
fDate :
6/1/1997 12:00:00 AM
Abstract :
Three dimensional structures can have high geometric factors and have thus been favoured in applications requiring high Q resonant elements. In this paper the surface resistance of YBCO thick film materials measured in the frequency range 1-10 GHz in a variety of resonant structures is discussed. The power dependence of the materials in the 1 to 2 GHz region is also examined and at these frequencies it is possible to attain Q´s of over 150000 using thick film materials.
Keywords :
Q-factor; barium compounds; dielectric resonators; high-temperature superconductors; superconducting cavity resonators; superconducting device testing; superconducting microwave devices; superconductor-insulator-superconductor devices; surface conductivity; thick film devices; thick films; yttrium compounds; 1 to 10 GHz; HTS dielectric resonators; YBaCuO; doctor blading; geometric factors; high Q resonators; high temperature superconductor; power dependence; screen printing; surface resistance; thick film coaxial resonators; thick films; Crystalline materials; Dielectrics; Frequency measurement; High temperature superconductors; Resonance; Superconducting materials; Surface resistance; Tellurium; Thick films; Yttrium barium copper oxide;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
