Title :
Dielectric properties of perovskite antimonates
Author :
Tidrow, S.C. ; Tauber, A. ; Wilber, W.D. ; Finnegan, R.D. ; Eckart, D.W. ; Drach, W.C.
Author_Institution :
Phys. Sci. Directirate, US Army Res. Lab., Fort Monmouth, NJ, USA
fDate :
6/1/1997 12:00:00 AM
Abstract :
In the search for lower dielectric constant substrates for use in a high critical temperature superconducting (HTSC) microwave technology, the dielectric constants and microwave loss tangents determined from the complex dielectric properties measured at 10 GHz and 300 K are reported for numerous perovskite antimonates like A/sub 2/MeSbO/sub 6/ where A=Ba or Sr, Me=a rare-earth, Y, Sc, Ga or In and A/sub 4/MeSb/sub 3/O/sub 12/ where A=Ba or Sr and Me=Li, Na or K. Using these material properties, the Clausius-Mossotti relationship and a nonlinear regression fitting program, the polarizability of Sb/sup 5+/ has been investigated and determined to be 1.18/spl plusmn/0.49 /spl Aring//sup 3/ which makes it an excellent candidate for use as a constituent in a HTSC microwave substrate technology.
Keywords :
dielectric losses; dielectric materials; high-temperature superconductors; microwave measurement; permittivity; polarisability; substrates; superconducting microwave devices; superconducting thin films; 10 GHz; 300 K; Ba/sub 2/RSbO/sub 6/; Ba/sub 4/ASb/sub 3/O/sub 12/; Clausius-Mossotti relationship; HTSC; Sb/sup 5+/; Sr/sub 2/RSbO/sub 6/; Sr/sub 4/ASb/sub 3/O/sub 12/; complex dielectric properties; dielectric properties; high critical temperature superconducting microwave technology; lower dielectric constant substrates; microwave loss tangents; microwave substrate technology; nonlinear regression fitting program; perovskite antimonates; polarizability; Dielectric constant; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Dielectric substrates; Microwave technology; Strontium; Superconducting materials; Superconducting microwave devices; Temperature;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
