Microwave measurements of superconducting Nb/sub 3/Sn films by a microstrip resonator technique

Author

Andreone, A. ; Cassinese, A. ; Di Chiara, A. ; Iavarone, M. ; Palomba, F. ; Ruosi, A. ; Vaglio, R.

Author_Institution

Dipartimento di Sci. Fisiche, Naples Univ., Italy

Volume

7

Issue

2

fYear

1997

fDate

6/1/1997 12:00:00 AM

Firstpage

1772

Lastpage

1775

Abstract

We report on r.f. measurements of the surface impedance Zs=Rs+iXs of Nb/sub 3/Sn superconducting films deposited on sapphire by planar magnetron sputtering. The measurements are performed by a microstrip resonator technique using a meander line geometry. The power dependence of Zs is studied at different temperatures and frequencies in the range 1-18 GHz. The effects of a d.c. magnetic field applied with different orientations is also studied. The data are analyzed in the context of different models.

Keywords

electric impedance; niobium alloys; sputtered coatings; superconducting thin films; tin alloys; type II superconductors; 1 to 18 GHz; Al/sub 2/O/sub 3/; DC magnetic field; Nb/sub 3/Sn; RF measurements; meander line geometry; microstrip resonator technique; microwave measurements; orientations; planar magnetron sputtering; power dependence; sapphire; superconducting Nb/sub 3/Sn films; surface impedance; Impedance measurement; Magnetic field measurement; Microwave measurements; Niobium; Sputtering; Superconducting films; Superconducting magnets; Superconducting microwave devices; Surface impedance; Tin;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.620926

Filename

620926