Title :
Analysis of thickness modes of contoured doubly rotated, quartz resonators
Author :
EerNisse, Errol P.
Author_Institution :
Quartzdyne Inc., Salt Lake City, UT, USA
Abstract :
It is the intent of this work to provide a working resource for calculating all three mode families of a doubly rotated, contoured quartz resonator. It is shown that the theoretical development of Stevens and Tiersten [1986] can be used for this purpose. Their approach uses a transformation of the mechanical displacement vector to the eigenvector triad of the pure thickness solution. The solution methodology here reorganizes the transformation matrix Q in their formulation to calculate the other two mode families. Calculations compare well with experimental results for the three mode families of an SC-cut crystal and an FC-cut crystal and with published calculations for the SBTC-cut mode family with major displacement along the as blank axis. The key constants for the SC-cut are presented for workers to use in the future. In addition, the equations of motion and boundary conditions are derived for the two additional mode families using assumptions parallel to those used by Stevens and Tiersten. Calculations with these equations are presented for completeness to support the present conclusions by showing the equivalence of either simply reorganizing the Q matrix or using separate equations for each of the three mode families.
Keywords :
crystal resonators; eigenvalues and eigenfunctions; elastic constants; FC-cut crystal; Q matrix; SBTC-cut mode family; SC-cut crystal; SiO/sub 2/; boundary conditions; contoured doubly rotated quartz resonators; eigenvector triad; equations of motion; mechanical displacement vector; mode families; pure thickness solution; thickness modes; transformation matrix; working resource; Boundary conditions; Cities and towns; Equations; Ferroelectric materials; Frequency control; Publishing; Temperature measurement; Temperature sensors; Ultrasonics, ferroelectrics, and frequency control;
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on