Title :
Wideband frequency-domain material characterization up to 500 GHz
Author :
Kazemipour, Alireza ; Hudlicka, Martin ; See-Khee Yee ; Salhi, Mohammed ; Kleine-Ostmann, Thomas ; Schrader, Thorsten
Author_Institution :
Phys.-Tech. Bundesanstalt (PTB), Braunschweig, Germany
Abstract :
A compact quasioptical setup is designed and optimized for material characterization in the frequency range 50 GHz to 500 GHz. The S-parameters are measured with a commercial Vector Network Analyzer (VNA) together with its mm/sub-mm frequency extenders. A simple practical calibration process is used to determine the diffracted waves on the material surface. A new method is proposed to extract the complex permittivity of the material under closed-form formulas which can help for a parametric error analysis. Several material slabs are measured and the results are presented and analyzed.
Keywords :
S-parameters; error analysis; network analysers; nondestructive testing; permittivity; S-parameters; VNA; closed-form formulas; complex permittivity; diffracted waves; frequency 50 GHz to 500 GHz; frequency extenders; parametric error analysis; quasioptical setup; vector network analyzer; wideband frequency-domain material characterization; Calibration; Frequency measurement; Materials; Permittivity; Permittivity measurement; Slabs; Uncertainty;
Conference_Titel :
Infrared, Millimeter, and Terahertz waves (IRMMW-THz), 2014 39th International Conference on
Conference_Location :
Tucson, AZ
DOI :
10.1109/IRMMW-THz.2014.6956130
