DocumentCode :
1528552
Title :
Introduction to mixed-signal ic test and measurement [Book Reviews]
Author :
Hsu, Hua-Chih
Volume :
17
Issue :
4
fYear :
2001
fDate :
7/1/2001 12:00:00 AM
Firstpage :
35
Lastpage :
35
Keywords :
Analog integrated circuits; Automatic testing; Books; Circuit testing; Design for testability; Digital integrated circuits; Electrical engineering; Instruments; Integrated circuit measurements; Integrated circuit testing;
fLanguage :
English
Journal_Title :
Circuits and Devices Magazine, IEEE
Publisher :
ieee
ISSN :
8755-3996
Type :
jour
DOI :
10.1109/MCD.2001.950062
Filename :
950062
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1528552
