DocumentCode

1528575

Title

Cmos memory circuits [Book Review]

Author

Joshi, Vinayak

Volume

17

Issue

4

fYear

2001

fDate

7/1/2001 12:00:00 AM

Firstpage

37

Lastpage

37

Keywords

Book reviews; CMOS memory circuits; Cams; Circuit noise; Radiation effects; Random access memory; Read only memory; Redundancy; Sections; Silicon;

fLanguage

English

Journal_Title

Circuits and Devices Magazine, IEEE

Publisher

ieee

ISSN

8755-3996

Type

jour

DOI

10.1109/MCD.2001.950076

Filename

950076