• DocumentCode
    1528713
  • Title

    Local growth studies of CVD diamond using a probe-like substrate

  • Author

    Berghaus, Jörg Oberste ; Meunier, Jean-Luc ; Gitzhofer, François

  • Author_Institution
    Plasma Technol. Res. Center, McGill Univ., Montreal, Que., Canada
  • Volume
    25
  • Issue
    5
  • fYear
    1997
  • fDate
    10/1/1997 12:00:00 AM
  • Firstpage
    1058
  • Lastpage
    1065
  • Abstract
    Diamond films produced by Ar/H2/CH4 RF induction plasmas have high growth rates but often lack uniformity across the substrate. In this paper, the diamond growth on a probe-like molybdenum substrate, 4.76 mm in diameter, is correlated with the location of the probe in the plasma flame. Optical emission spectroscopy is used to characterize the plasma during deposition. The differences in gas temperature and electron density between the central and the outer region of the flame, as well as the variations in heat flux to the substrate at the different positions, are well reflected in the formed deposit. It is shown that uniform growth can only be expected within the homogeneous core of the plasma. The paper also addresses the gas phase boundary layer above the growing film. Spatially resolved emission spectroscopy measurements of concentration evolution inside the boundary layer region are made possible by the small dimensions of the substrate. A decrease in thermal boundary layer thickness from approximately 4.5 to 3 mm induced by an increase in plasma power enhances the lateral growth of the individual diamond crystallites and improves surface coverage. The typical film thickness growth rate of 70 μm/h is, however, not seen to be affected
  • Keywords
    diamond; plasma CVD; plasma density; plasma diagnostics; plasma temperature; Ar/H2/methane RF induction plasmas; C; CVD diamond; boundary layer region; diamond films; electron density; gas phase boundary layer; gas temperature; heat flux; local growth studies; optical emission spectroscopy; probe-like Mo substrate; probe-like substrate; spatially resolved emission spectroscopy measurements; thermal boundary layer thickness; Argon; Fires; Optical films; Plasma density; Plasma measurements; Plasma temperature; Probes; Radio frequency; Spectroscopy; Substrates;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/27.649626
  • Filename
    649626