DocumentCode :
1528773
Title :
Year 2000 impact on automated testing
Author :
Waken, W. ; Hitt, George
Author_Institution :
Battelle Memorial Inst., Ogden, UT, USA
Volume :
14
Issue :
7
fYear :
1999
fDate :
7/1/1999 12:00:00 AM
Firstpage :
5
Lastpage :
8
Abstract :
Both US military and industry rely on automatic testing to verify the quality of manufacture and repair. Many testers still rely on computers designed and manufactured in the early 1980´s. This includes systems using embedded controllers. Year 2000 problems can surface in computer operating systems, compilers, test programs, and in embedded systems. Until the impact of the Y2K “bug” is addressed, the risk of test program failure is unknown in most legacy automatic test systems. Problems may include embedded controllers in proprietary designs, old operating systems, and unique test program code. This paper will address the potential problem areas in automatic testing, and suggest an approach for determining the best course of action. In order to evaluate the impact, a complete systems inventory must be done to identify all potential sources of problems. Little attention has been paid to the legacy automated test systems and the potential impact of the Y2K problem on such systems. Although newer systems are less likely to be affected, no one can be sure until a complete inventory and test has been accomplished
Keywords :
automatic test equipment; automatic test software; embedded systems; operating systems (computers); program debugging; risk management; automatic testing; compilers; complete systems inventory; computer operating systems; embedded controllers; embedded systems; legacy automatic test systems; potential problem sources; test program failure risk; test programs; unique test program code; year 2000 problems; Automatic control; Automatic testing; Computer aided manufacturing; Control systems; Defense industry; Electrical equipment industry; Manufacturing industries; Military computing; Operating systems; System testing;
fLanguage :
English
Journal_Title :
Aerospace and Electronic Systems Magazine, IEEE
Publisher :
ieee
ISSN :
0885-8985
Type :
jour
DOI :
10.1109/62.774895
Filename :
774895
Link To Document :
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