Automated microwave measurements of microstrip ring resonators at low temperatures

Author

Tonkin, B.A. ; Hosking, M.W.

Author_Institution

Dept. of Electr. Eng., Portsmouth Polytech., UK

Volume

7

Issue

2

fYear

1997

fDate

6/1/1997 12:00:00 AM

Firstpage

1865

Lastpage

1868

Abstract

The high frequency properties of both substrates and superconducting materials have been determined from relatively large area microstrip resonator circuits mounted in an automated measurement system. Properties such as dielectric constant and surface resistance are presented for a variety of materials, such as YBa/sub 2/Cu/sub 3/O/sub 7-x/, Tl/sub 2/Ba/sub 2/Ca/sub 2/Cu/sub 3/O/sub x/, Cu and Ag on either yttria-stabilised zirconia, MgO or plastic substrates. The surface resistance of thick film YBa/sub 2/Cu/sub 3/O/sub 7-x/ ring resonators on yttria-stabilised zirconia substrates were found to be limited by the loss tangent of the substrate while the surface resistance of similarly-sized Tl/sub 2/Ba/sub 2/Ca/sub 2/Cu/sub 3/O/sub x/ thin film ring resonators on MgO substrates showed a marked power dependence. At 3 GHz the surface resistance of thick film YBa/sub 2/Cu/sub 3/O/sub 7-x/ on yttria-stabilised zirconia at -10 dBm was found to be superior to thin film Tl/sub 2/Ba/sub 2/Ca/sub 2/Cu/sub 3/O/sub x/ on MgO below T/sub C//2 as a result of better power handling.

Keywords

barium compounds; calcium compounds; electric resistance measurement; electrical resistivity; high-temperature superconductors; microstrip resonators; permittivity; permittivity measurement; superconducting cavity resonators; superconducting device testing; thallium compounds; yttrium compounds; 0.5 to 5.5 GHz; 10 to 290 K; 3 GHz; Ag; Cu; MgO; Tl/sub 2/Ba/sub 2/Ca/sub 2/Cu/sub 3/O; Tl/sub 2/Ba/sub 2/Ca/sub 2/Cu/sub 3/O/sub x/; YBa/sub 2/Cu/sub 3/O/sub 7-x/; YBa/sub 2/Cu/sub 3/O/sub 7/; ZrO/sub 2/-Y/sub 2/O/sub 3/; automated microwave measurements; dielectric constant; high frequency properties; loss tangent; low temperatures; microstrip ring resonators; plastic substrates; power dependence; power handling; relatively large area microstrip resonator circuits; substrates; superconducting materials; surface resistance; yttria-stabilised zirconia; Dielectric measurements; Electrical resistance measurement; Microstrip resonators; Microwave measurements; Optical ring resonators; Substrates; Superconducting materials; Surface resistance; Thick films; Transistors;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.620948

Filename

620948