Propagation characteristics of Schottky contact suspended slow-wave microstrip line

Author

Verma, A.K. ; Nasimuddin

Author_Institution

Dept. of Electron. Sci., Delhi Univ., India

Volume

11

Issue

9

fYear

2001

Firstpage

385

Lastpage

387

Abstract

The single-layer reduction (SLR) model computes the normalized phase constant (/spl beta///spl beta//sub 0/), dielectric loss (/spl alpha//sub d/), and conductor loss (/spl alpha//sub c/) for the Schottky contact slow-wave microstrip (SCSM) line with accuracy about 2.0% for /spl beta///spl beta//sub 0/, and within 0.01 dB/mm for the total loss (/spl alpha//sub t/=/spl alpha//sub d/+/spl alpha//sub c/) as compared against the experimental results. The SLR model has been further used to analyze the normal and abnormal characteristics of a proposed Schottky contact suspended slow-wave microstrip (SCSSM) line with 22% increase in /spl beta///spl beta//sub 0/ over the normal SCSM line. The SCSSM line could be useful in the lower range of RF for the development of compact components.

Keywords

Schottky barriers; microstrip lines; slow wave structures; RF propagation; Schottky contact slow-wave microstrip line; Schottky contact suspended slow-wave microstrip line; conductor loss; dielectric loss; normalized phase constant; single-layer reduction model; Bandwidth; Capacitance; Conductors; Dielectric constant; Dielectric losses; Microstrip; Permittivity; Propagation losses; Schottky barriers; Voltage;

fLanguage

English

Journal_Title

Microwave and Wireless Components Letters, IEEE

Publisher

ieee

ISSN

1531-1309

Type

jour

DOI

10.1109/7260.950769

Filename

950769