Investigation of radiated susceptibility during EFT tests

The aim of this paper is to focus on a problem: during an electrical fast transient (EFT) conducted susceptibility test, a very strong radiated field is produced and a radiated coupling with the internal circuitry of the equipment under test (EUT) occurs. Therefore in case of EUT malfunctions, it is difficult to understand whether the resulting failures are due to the injected conducted current (requiring a filtering action) or to the impinging radiated EM field (requiring a shielding action). A model to describe the EM radiation, coming from the current flowing along the EUT power cord, is presented as well as its experimental validation