• DocumentCode
    1529493
  • Title

    ESD field penetration through slots into shielded enclosures: a time domain approach

  • Author

    Cerri, Graziano ; De Leo, Roberto ; De Rentiis, Roberto ; Primiani, Valter Mariani

  • Author_Institution
    Dipt. di Elettronica e Autom., Ancona Univ., Italy
  • Volume
    39
  • Issue
    4
  • fYear
    1997
  • fDate
    11/1/1997 12:00:00 AM
  • Firstpage
    377
  • Lastpage
    386
  • Abstract
    This paper presents a time domain approach for the analysis of the coupling between an electrostatic discharge (ESD) current and the internal region of a shielded enclosure with a slot. The application of the equivalence principle allows us to obtain an integro-differential equation for the unknown distribution of the aperture electric field. The numerical solution is obtained by an iterative procedure developed by the method of moments (MoM) in the time domain. The approach is also applied at the case of a transient incident field of a plane wave impinging on the enclosure. The use of proper impulse responses for the space and cavity regions make the model efficient from a computational point of view, without loss in accuracy. Theoretical results are validated by measurements
  • Keywords
    electromagnetic fields; electromagnetic shielding; electrostatic discharge; integro-differential equations; iterative methods; method of moments; time-domain analysis; transient analysis; transient response; ESD field penetration; aperture electric field; cavity regions; computational efficiency; coupling; electrostatic discharge current; equivalence principle; impulse responses; integro-differential equation; iterative procedure; method of moments; plane wave; shielded enclosures; space and cavity region; time domain approach; transient incident field; Apertures; Electromagnetic compatibility; Electromagnetic coupling; Electrostatic analysis; Electrostatic discharge; Finite difference methods; Frequency domain analysis; Integrodifferential equations; Moment methods; Time domain analysis;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/15.649842
  • Filename
    649842