DocumentCode
1529637
Title
Controlling the crystallographic orientation in ultrathin L10 FePt(111) films on MgO(111) underlayer
Author
Jeong, Jae-Yoon ; Kim, Jung-Gi ; Bae, Seung-Young ; Shin, Kyung-Ho
Author_Institution
Dept. of Phys., Hanyang Univ., Seoul, South Korea
Volume
37
Issue
4
fYear
2001
fDate
7/1/2001 12:00:00 AM
Firstpage
1268
Lastpage
1270
Abstract
Controlling the crystallographic orientation in ultrathin FePt longitudinal media for ultrahigh recording density is discussed with introducing sputtered MgO(111) underlayers selected as a template for inducing (111) texture in the FePt films. The MgO(111) underlayers significantly enhanced the crystallographic texture of FePt(111) for films as thin as 10 nm or less. Full width at half maximum (FWHM) of FePt(111) reflection measured from XRD rocking curves and coercivity squareness (S*) confirmed the strong in-plane texture of the FePt films deposited on MgO(111) underlayers. FWHM and S* were 8° and 0.8, respectively. High coercivity of 3200 Oe could be achieved in films with very low Mrt of 0.3 memu/cm2 at moderate annealing temperature (⩽500°C) which retained small grains
Keywords
X-ray diffraction; coercive force; crystal orientation; ferromagnetic materials; iron alloys; magnetic recording; magnetic thin films; platinum alloys; sputtered coatings; texture; (111) texture; 10 nm; 500 C; FWHM; FePt longitudinal media; FePt-MgO; MgO(111) underlayer; XRD rocking curves; annealing temperature; coercivity squareness; crystallographic orientation control; crystallographic texture; in-plane texture; sputtered MgO(111) underlayers; ultrahigh recording density; ultrathin L10 FePt(111) films; Amorphous magnetic materials; Annealing; Coercive force; Crystallography; Magnetic films; Optical films; Sputtering; Substrates; Temperature; Transistors;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/20.950814
Filename
950814
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